BiFAST has extensive experience in ASIC design. Focusing on high-speed design, ranging from 25 Gbps to 400 Gbps, including 100 Gbps over single-lambda, the BiFAST team has developed and tested ASICs for a wide range of applications.
BiFAST has an in-house developed test platform for high-speed connectivity ranging from 10 Gbps up to 100 Gbps. Additionally, BiFAST has access to a lab with state-of-the-art measurement equipment, including sampling oscilloscopes up to 70 GHz, VNA up to 67 GHz, real-time oscilloscope up to 67 GHz, ...
In-house test platform
BiFAST has developed an in-house FPGA-based test platform allowing high-speed measurements ranging from 10 Gbps up to 100 Gbps. This platform allows for very fast and cost-efficient measurement of high speed ASICs.
With access to measurement equipment such as sampling oscilloscope up to 70 GHz, a VNA up to 67 GHz, real-time scope up to 67 GHz, AWG up to 92 GSps, BERT up to 56 Gbps, ... BiFAST has the capabilities and accurately measure and verify the performance of the ASICs designed.
The in-house developed control platform uses either an SPI or I2C backbone and significantly improves test times thanks to the very intuitive user interface.
Measurements are automated through custom scripting wherever possible to optimize measurement times.